Gustavo Neuberger

Protecting Chips Against Hold Time Violations Due to Variability

Ebook (PDF Format)

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The consequences of variability to several aspects of circuit design, such as logic gates, storage elements, clock distribution, and any other that can be affected by process variations are discussed, with a key focus on storage elements. The authors present a statistical analysis of the critical clock skew in several test paths, due to process variability in 130nm and 90nm CMOS technology. To facilitate an on-wafer test, a measurement ci… Mehr

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Produktdetails

Weitere Autoren: Wirth, Gilson / Reis, Ricardo

ISBN: 978-94-007-2427-3
EAN: 9789400724273
Produktnummer: 18259329
Verlag: Springer-Verlag GmbH
Sprache: Englisch
Erscheinungsjahr: 2013
Seitenangabe: 107 S.
Plattform: PDF
Masse: 5'122 KB
Auflage: 2014
Abbildungen: 25 schwarz-weiße und 51 farbige Abbildungen, 23 schwarz-weiße Tabellen, Bibliographie