Electronic Design Automation: Synthesis, Verification, and Test
This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an adjacent field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit greatly from this book.
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Produktdetails
Weitere Autoren: Chang, Yao-Wen (Hrsg.) / Cheng (Hrsg.)
- ISBN: 978-0-12-374364-0
- EAN: 9780123743640
- Produktnummer: 3730487
- Verlag: Morgan Kaufmann Publ Inc
- Sprache: Englisch
- Erscheinungsjahr: 2009
- Seitenangabe: 934 S.
- Masse: H28.7 cm x B22.2 cm x D5.5 cm 2'841 g
- Gewicht: 2841
Über den Autor
Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007). Yao-Wen Chang, Ph.D., is a Professor in the Department of Electrical Engineering, National Taiwan University. He recevied his Ph.D. degree in Computer Science from the University of Texas at Austin. He has published over 200 technical papers, co-authored one book, and is a winner of the ACM ISPD Placement (2006) and Global Routing (2008) contests. Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.
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