Advances in X-Ray Analysis
Volume 28
The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. T…
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Produktdetails
Weitere Autoren: Predecki, Paul K. (Hrsg.)
- ISBN: 978-1-4612-9499-3
- EAN: 9781461294993
- Produktnummer: 15468155
- Verlag: Springer Us
- Sprache: Englisch
- Erscheinungsjahr: 2011
- Seitenangabe: 412 S.
- Masse: H25.4 cm x B17.8 cm x D2.2 cm 771 g
- Auflage: Softcover reprint of the original 1st ed. 1985
- Abbildungen: Paperback
- Gewicht: 771
6 weitere Werke von Charles S. (Hrsg.) Barrett:
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