Test Pattern Generation using Boolean Proof Engines
After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for Automatic Test Pattern Generation (ATPG) have been proposed in the last 30 years. But due to the ever increasing design complexity, new techniques have to be developed that can cope with today's circuits. While classical approaches are based on backtracking on the circuit structure, several approaches based on Boolean Satisfiability (SAT) have been proposed since the early 80s. In Test Pattern Generation using Boolean P…
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Produktdetails
Weitere Autoren: Eggersglüß, Stephan / Fey, Görschwin / Tille, Daniel
- ISBN: 978-90-481-2360-5
- EAN: 9789048123605
- Produktnummer: 12814982
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2009
- Plattform: PDF
- Masse: 5'501 KB
- Auflage: 2009
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