Mismatch and Noise in Modern IC Processes
Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block circuits of modern integrated circuits, from the perspective of a circuit designer. Variability usually refers to a large scale variation that can occur on a wafer to wafer and lot to lot basis, and over long distances on a wafer. This phenomenon is well understood and the effects of variability are included in most integrated circuit design with the use of corner or statistical…
Mehr
CHF 50.90
Preise inkl. MwSt. und Versandkosten (Portofrei ab CHF 40.00)
V103:
Folgt in ca. 5 Arbeitstagen
Produktdetails
- ISBN: 978-1-59829-941-0
- EAN: 9781598299410
- Produktnummer: 4755280
- Verlag: Morgan & Claypool Publishers
- Sprache: Englisch
- Erscheinungsjahr: 2009
- Seitenangabe: 152 S.
- Masse: H23.5 cm x B19.1 cm x D0.8 cm 298 g
- Abbildungen: Paperback
- Gewicht: 298
81 weitere Werke von Andrew Marshall:
Bewertungen
Anmelden