David C. Joy
Helium Ion Microscopy
Principles and Applications
Ebook (PDF Format)
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced Secondary Electron (iSE) generation by ions are discussed, and an extensive…
Mehr
Beschreibung
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced Secondary Electron (iSE) generation by ions are discussed, and an extensive database of iSE yields for many elements and compounds as a function of incident ion species and its energy is included. Beam damage and charging are frequently outcomes of ion beam irradiation, and techniques to minimize such problems are presented. In addition to imaging, ions beams can be used for the controlled deposition, or removal, of selected materials with nanometer precision. The techniques and conditions required for nanofabrication are discussed and demonstrated. Finally, the problem of performing chemical microanalysis with ion beams is considered. Low energy ions cannot generate X-ray emissions, so alternative techniques such as Rutherford Backscatter Imaging (RBI) or Secondary Ion Mass Spectrometry (SIMS) are examined.Serves as a concise but authoritative introduction to the latest innovation in scanning microscopyCompares ion and electron beams as options for microscopy Presents a detailed physical model of ion-solid interactions and signal generation Provides a detailed database of iSE yield behavior as a function of the target ion, element, and energy
CHF 65.00
Preise inkl. MwSt. und Versandkosten (Portofrei ab CHF 40.00)
Versandkostenfrei
Produktdetails
- ISBN: 978-1-4614-8660-2
- EAN: 9781461486602
- Produktnummer: 18261666
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2013
- Seitenangabe: 64 S.
- Plattform: PDF
- Masse: 2'218 KB
- Auflage: 2013
- Abbildungen: 13 schwarz-weiße und 16 farbige Abbildungen, 2 schwarz-weiße Tabellen, Bibliographie
20 weitere Werke von David C. Joy:
Principles and Applications
Ebook (PDF Format)
CHF 130.00
Principles and Applications
Ebook (PDF Format)
CHF 94.50
Principles and Applications
Ebook (PDF Format)
CHF 183.15
Principles and Applications
Ebook (PDF Format)
CHF 141.50
Principles and Applications
Ebook (PDF Format)
CHF 153.50
Principles and Applications
Ebook (PDF Format)
CHF 118.00
Bewertungen
0 von 0 Bewertungen
Anmelden
Keine Bewertungen gefunden. Seien Sie der Erste und teilen Sie Ihre Erkenntnisse mit anderen.