Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding…
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Produktdetails
Weitere Autoren: Schrimpf, Ronald D (Hrsg.)
- ISBN: 978-981-238-940-4
- EAN: 9789812389404
- Produktnummer: 20398172
- Verlag: World Scientific Publishing Company
- Sprache: Englisch
- Erscheinungsjahr: 2004
- Seitenangabe: 348 S.
- Masse: H23.5 cm x B15.7 cm x D2.3 cm 657 g
- Abbildungen: HC gerader Rücken kaschiert
- Gewicht: 657
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