Brent Fultz

Transmission Electron Microscopy and Diffractometry of Materials

Buch

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements.… Mehr

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Produktdetails

Weitere Autoren: Howe, James

ISBN: 978-3-642-29760-1
EAN: 9783642297601
Produktnummer: 12962694
Verlag: Springer-Verlag GmbH
Sprache: Englisch
Erscheinungsjahr: 2012
Seitenangabe: 761 S.
Masse: H24.1 cm x B16.0 cm x D4.6 cm 1'326 g
Auflage: 4th edition
Abbildungen: Book; 500 schwarz-weiße Abbildungen
Gewicht: 1326

Über den Autor

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials. James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.