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Dipak K. (Hrsg.) Dey

Extreme Value Modeling and Risk Analysis

Methods and Applications

Ebook (PDF Format)

Extreme Value Modeling and Risk Analysis: Methods and Applications presents a broad overview of statistical modeling of extreme events along with the most recent methodologies and various applications. The book brings together background material and advanced topics, eliminating the need to sort through the massive amount of literature on the subje

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Produktdetails


Weitere Autoren: Yan, Jun (Hrsg.)
  • ISBN: 978-1-4987-0131-0
  • EAN: 9781498701310
  • Produktnummer: 19556924
  • Verlag: Taylor & Francis Ltd.
  • Sprache: Englisch
  • Erscheinungsjahr: 2016
  • Seitenangabe: 540 S.
  • Plattform: PDF
  • Masse: 44'802 KB

Über den Autor


Jun Yan is a professor in the Department of Statistics at the University of Connecticut. He was previously an assistant professor at the University of Iowa. He received a Ph.D. in statistics from the University of Wisconsin-Madison. His research interests include spatial extremes, copulas, survival analysis, estimating equations, clustered data analysis, statistical computing, and applications in public health and environment.Dipak K. Dey is a Board of Trustees Distinguished Professor in the Department of Statistics and associate dean of the College of Liberal Arts and Sciences at the University of Connecticut. He is an elected fellow of the International Society for Bayesian Analysis and American Association for the Advancement of Science, an elected member of the Connecticut Academy of Arts and Sciences and International Statistical Institute, and a fellow of the American Statistical Association and Institute of Mathematical Statistics. Dr. Dey is a co-editor and co-author of several books, including the Chapman & Hall/CRC Bayesian Modeling in Bioinformatics and A First Course in Linear Model Theory. His research interests include Bayesian analysis, bioinformatics, biostatistics, computational statistics, decision theory, environmental statistics, multivariate analysis, optics, reliability and survival analysis, statistical shape analysis, and statistical genetics.

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