Microwave Electronics
Measurement and Materials Characterization
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book: Provides a comprehensive introduction to microwave theory and microwave measurement techniques. Examines every aspect of microwave material properties, circuit design and appl…
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Produktdetails
Weitere Autoren: Neo, C. P. / Varadan, V. V. / Varadan, Vijay K. / Ong, C. K.
- ISBN: 978-0-470-02045-6
- EAN: 9780470020456
- Produktnummer: 13964392
- Verlag: Wiley
- Sprache: Englisch
- Erscheinungsjahr: 2004
- Seitenangabe: 552 S.
- Plattform: PDF
- Masse: 7'040 KB
Über den Autor
L. F. Chen is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. C. K. Ong is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. C. P. Neo is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. V. V. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley. Vijay K. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
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