Machine Learning in VLSI Computer-Aided Design
This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design.Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon v…
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Produktdetails
Weitere Autoren: Li, Xin (Hrsg.) / Boning, Duane S. (Hrsg.)
- ISBN: 978-3-030-04666-8
- EAN: 9783030046668
- Produktnummer: 30468686
- Verlag: Springer
- Sprache: Englisch
- Erscheinungsjahr: 2019
- Plattform: PDF
- Masse: 24'514 KB
Über den Autor
112652061
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