Surface Analysis of Polymers by XPS and Static Sims
This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary an…
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Produktdetails
Weitere Autoren: Clarke, D. R. (Hrsg.) / Suresh, S. (Hrsg.)
- ISBN: 978-0-521-35222-2
- EAN: 9780521352222
- Produktnummer: 10963880
- Verlag: Cambridge University Press
- Sprache: Englisch
- Erscheinungsjahr: 2011
- Seitenangabe: 214 S.
- Masse: H26.0 cm x B18.3 cm x D1.6 cm 609 g
- Abbildungen: HC gerader Rücken kaschiert
- Gewicht: 609
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