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Allen J. (Hrsg.) Bard

Scanning Electrochemical Microscopy

Buch

Because of its simplicity of use and quantitative results, Scanning Electrochemical Microscopy (SECM) has become an indispensable tool for the study of surface reactivity. The fast expansion of the SECM field during the last several years has been fueled by the introduction of new probes, commercially available instrumentation, and new practical applications. Scanning Electrochemical Microscopy, Second Edition offers essential background and in-depth overviews of specific applications in self-contained chapters. Recent methodological advances have greatly increased the capacity of SECM to characterize interfaces at the nanoscale and to obtain… Mehr

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Produktdetails


Weitere Autoren: Mirkin, Michael V. (Hrsg.)
  • ISBN: 978-1-4398-3112-0
  • EAN: 9781439831120
  • Produktnummer: 11984696
  • Verlag: Crc Pr Inc
  • Sprache: Englisch
  • Erscheinungsjahr: 2012
  • Seitenangabe: 660 S.
  • Masse: H27.1 cm x B18.4 cm x D4.1 cm 1'759 g
  • Auflage: 2. A.
  • Gewicht: 1759

Über den Autor


Allen J. Bard was born in New York City in 1933 and grew up and attended public schools there, including the Bronx High School of Science (1948-51). He attended The City College of the College of New York (CCNY) (B.S., 1955) and Harvard University (M.A., 1956, PhD., 1958). He joined the faculty at The University of Texas at Austin (UT) in 1958, where he spent his entire career.His research interests involve the application of electrochemical methods to the study of chemical problems and include investigations in scanning electrochemical microscopy, electrogenerated chemiluminescence and photoelectrochemistry.

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