X-Ray Diffraction Crystallography
Introduction, Examples and Solved Problems
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained.To learn the method of X-ray diffraction crystallography well and to be able to cope with…
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Produktdetails
Weitere Autoren: Matsubara, Eiichiro / Waseda, Yoshio
- ISBN: 978-3-642-16635-8
- EAN: 9783642166358
- Produktnummer: 12841572
- Verlag: Springer
- Sprache: Englisch
- Erscheinungsjahr: 2011
- Seitenangabe: 310 S.
- Plattform: PDF
- Masse: 10'457 KB
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