New Technologies in Electromagnetic Non-destructive Testing
This book introduces novel developments in the field of electromagnetic non-destructive testing and evaluation (NDT/E). The topics include electromagnetic ultrasonic guided wave testing, pulsed eddy current testing, remote field eddy current testing, low frequency eddy current testing, metal magnetic memory testing, and magnetic flux leakage testing. Considering the increasing concern about the safety maintenance of critical structures in various industries and everyday life, these topics presented here will be of particular interest to the readers in the NDT/E field. This book covers both theoretical researches and the engineering applicatio…
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Produktdetails
Weitere Autoren: Wang, Shen
- ISBN: 978-981-10-0577-0
- EAN: 9789811005770
- Produktnummer: 19322193
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2016
- Seitenangabe: 222 S.
- Masse: H24.1 cm x B16.0 cm x D1.8 cm 518 g
- Abbildungen: Book; 220 schwarz-weiße Abbildungen, Bibliographie
- Gewicht: 518
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