Defects and Diffusion, Theory & Simulation II

This second volume in a new series covering entirely general results in the fields of defects and diffusion includes 356 abstracts of papers which appeared between the end of 2009 and the end of 2010. As well as the abstracts, the volume includes original papers on theory/simulation, semiconductors and metals: &quote;Predicting Diffusion Coefficients from First Principles ...&quote; (Mantina, Chen & Liu), &quote;Gouge Assessment for Pipes ...&quote; (Meliani, Pluvinage & Capelle), &quote;Simulation of the Impact Behaviour of ... Hollow Sphere Structures&quote; (Ferrano, Speich, Rimkus, Merkel & Ochsner), &quote;Elastic-Plastic Fracture Mechanics Model ...&quote; (Liao), &quote;Calculation of Fracture Toughness for Hydrogen Embrittlement ...&quote; (Mahdavi & Mashhadi), &quote;... Method to Describe the Role of Diffusion in Catalyst Design&quote; (Zeynali), &quote;... Axial Shift and Spin Hamiltonian Parameters for Mn2+ in CdS ...&quote; (Wang, Wu, Hu & Xu), &quote;Structure and Electronic Properties of Evaporated Thin Films of Lead Sulfide&quote; (Ibrahim), &quote;Acoustic Emission during Isothermal Oxidation of ... Steel&quote; (Jha, Mishra & Ojha), &quote;... Carbon Content versus Heating Temperature in Austenitizing of Cast Iron&quote; (Gong & Xiang), &quote;Exploration of Parameters of Ashcroft's Potential ...&quote; (Ghorai), Effect of Tribological Parameters upon Mechanical Wear ...&quote; (El Azizi, Meliani, Belalia & Benamar)The 10 original papers consider theory and simulation, metals, ceramics, semiconductors, and miscellaneous matters. The topics include computational fluid dynamics based on the simulated study of multi-phase fluid flows, the role of silicon in powder metallurgically processed soft magnetic alloy, a voltage switch of nanometer sized zinc oxide ceramic defected barium, a survey of the literature on silica refractory research and development focusing on nanostructured silica obtained from rice husk ash, slow positron studies in polymers, and a model and simulated analysis for reliability and failure in micro-electro-mechanical fabrication. The second half of the volume is devoted to abstracts of over 200 additional papers. There is no index.