Applied Scanning Probe Methods XII
Characterization
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have…
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Produktdetails
Weitere Autoren: Fuchs, Harald (Hrsg.)
- ISBN: 978-3-540-85038-0
- EAN: 9783540850380
- Produktnummer: 4028478
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2008
- Seitenangabe: 224 S.
- Masse: H24.1 cm x B16.0 cm x D2.0 cm 594 g
- Gewicht: 594
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