Quantum Metrology, Imaging, and Communication
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
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Produktdetails
Weitere Autoren: Jaeger, Gregg / Sergienko, Alexander V.
- ISBN: 978-3-319-46551-7
- EAN: 9783319465517
- Produktnummer: 21721514
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2016
- Seitenangabe: 273 S.
- Plattform: PDF
- Masse: 7'137 KB
- Auflage: 1st ed. 2017
- Abbildungen: 37 schwarz-weiße und 68 farbige Abbildungen, 40 farbige Tabellen, Bibliographie
Über den Autor
David Simon. Professor, Stonehill College, Easton MA 02357, USA Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA Alexander V. Sergienko, Boston University, Boston MA 02215, USA
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