Advanced Tomographic Methods in Materials Research and Engineering [With CDROM]
Tomography provides three-dimensional images of materials or engineering components and an unprecedented insight into their internal structure. This book, written for applied physicists, materials scientists and engineers, discusses recent developments in the field, such as the extension of tomographic methods to materials research and engineering.
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Produktdetails
- ISBN: 978-0-19-921324-5
- EAN: 9780199213245
- Produktnummer: 23005670
- Verlag: OXFORD UNIV PR
- Sprache: Englisch
- Erscheinungsjahr: 2008
- Seitenangabe: 462 S.
- Masse: H23.9 cm x B15.6 cm x D2.7 cm 957 g
- Abbildungen: CDROM
- Reihenbandnummer: 66
- Gewicht: 957
Über den Autor
John Banhart - EditorProfessor for Materials Science at Technical University Berlin and Head of the Department of Materials Research at Hahn-Meitner Institute Berlin1984: Degree in Physics, University of Munich1989: PhD in Physical Chemistry, University of Munich1990: Postdoc at University of Vienna 1998: Habilitation (2nd PhD) in Solid State Physics, University of Bremen1991-2001: Senior Scientist at Fraunhofer-Institute for Materials Research Bremen2002: Current Position
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