Nonlinear Transistor Model Parameter Extraction Techniques
Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor mode…
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Produktdetails
- ISBN: 978-1-139-15366-9
- EAN: 9781139153669
- Produktnummer: 13862098
- Verlag: Cambridge University Press
- Sprache: Englisch
- Erscheinungsjahr: 2011
- Seitenangabe: 0 S.
- Plattform: PDF
- Masse: 13'872 KB
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