Rfid Technology and Applications
Addresses the challenges, trends and key business questions in RFID development and implementation.
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Produktdetails
Weitere Autoren: Sarma, Sanjay E. (Hrsg.) / Williams, John R. (Hrsg.)
- ISBN: 978-0-521-88093-0
- EAN: 9780521880930
- Produktnummer: 3461274
- Verlag: Cambridge University Press
- Sprache: Englisch
- Erscheinungsjahr: 2016
- Seitenangabe: 244 S.
- Masse: H25.0 cm x B17.5 cm x D1.7 cm 609 g
- Abbildungen: HC gerader Rücken kaschiert
- Gewicht: 609
Über den Autor
Stephen B. Miles is a research engineer for the Auto-ID Lab. at MIT. He has over 15 years of experience in computer network integration and services. Sanjay E. Sarma is currently an associate professor at MIT, where he is also a co-founder of the Auto-ID Center. He serves on the board of EPC global, the world wide standards body he helped to start up. John R. Williams is Director of the Auto-ID Lab at MIT, and is also a professor of Information Engineering in Civil and Environmental Engineering. As well as many years of lecturing, he has also worked in industry and was the Vice President of Engineering at two software start-up companies.
1 weiteres Werk von Stephen B. (Hrsg.) Miles:
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