Peter Eaton

Atomic Force Microscopy

Buch

Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes… Mehr

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Produktdetails

Weitere Autoren: West, Paul

ISBN: 978-0-19-957045-4
EAN: 9780199570454
Produktnummer: 22676342
Verlag: OXFORD UNIV PR
Sprache: Englisch
Erscheinungsjahr: 2010
Seitenangabe: 248 S.
Masse: H26.0 cm x B17.9 cm x D2.0 cm 643 g
Gewicht: 643

Über den Autor

Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM.Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.