Scanning Electron Microscopy and X-ray Microanalysis
Third Edition
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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Produktdetails
Weitere Autoren: Goldstein, Joseph / Joy, David C. / Lifshin, Eric / Lyman, Charles E. / Michael, J. R. / Newbury, Dale E. / Sawyer, Linda
- ISBN: 978-1-4613-4969-3
- EAN: 9781461349693
- Produktnummer: 15407467
- Verlag: Springer Us
- Sprache: Englisch
- Erscheinungsjahr: 2013
- Seitenangabe: 720 S.
- Masse: H25.4 cm x B17.7 cm x D4.3 cm 1'289 g
- Auflage: 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003
- Abbildungen: Paperback
- Gewicht: 1289
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