Helium Ion Microscopy
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leadi…
Mehr
CHF 153.50
Preise inkl. MwSt. und Versandkosten (Portofrei ab CHF 40.00)
Versandkostenfrei
Produktdetails
Weitere Autoren: Gölzhäuser, Armin (Hrsg.)
- ISBN: 978-3-319-41990-9
- EAN: 9783319419909
- Produktnummer: 21103250
- Verlag: Springer
- Sprache: Englisch
- Erscheinungsjahr: 2016
- Plattform: PDF
- Masse: 30'328 KB
2 weitere Werke von Gregor (Hrsg.) Hlawacek:
Bewertungen
Anmelden