Patrick Nolan

CIA Rogues and the Killing of the Kennedys

How and Why US Agents Conspired to Assassinate JFK and RFK

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Produktdetails

Weitere Autoren: Lee, Henry C. (Vorb.)

ISBN: 978-1-63450-273-3
EAN: 9781634502733
Produktnummer: 17877063
Verlag: Simon & Schuster N.Y.
Sprache: Englisch
Erscheinungsjahr: 2015
Seitenangabe: 384 S.
Ausstattung: Trade Paperback
Masse: H22.9 cm x B15.2 cm 439 g
Abbildungen: s/w. Abb.
Gewicht: 439

Über den Autor

Patrick Nolan is a forensic historian that has dedicated his life to uncovering truths surrounding the JFK, MLK, and RFK assassinations of the 1960s. He’s been a journalist, a television news producer, and professor at Hofstra University and St. John’s University. He lives with his wife in West Hartford, Connecticut.Henry C. Lee, PhD, is one of the world’s most respected and revered forensic scientists. Born in China, he pursued his education in America, earning a BS in Forensic Science from John Jay College of Criminal Justice in New York in 1972. He then studied science and biochemistry at New York University, earning his MS in 1974 and his PhD in Biochemistry in 1975. He has worked on such famous cases as: the O. J. Simpson trial, the Laci Peterson murder, the JonBenet Ramsey murder, the post-9/11 forensic investigation, and more.