Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions…
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Produktdetails
Weitere Autoren: Tan, Sheldon X. -D. / Yu, Hao
- ISBN: 978-1-4614-0788-1
- EAN: 9781461407881
- Produktnummer: 16278002
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2014
- Seitenangabe: 306 S.
- Plattform: PDF
- Masse: 7'540 KB
- Auflage: 2012
- Abbildungen: 61 schwarz-weiße Tabellen, Bibliographie
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