VLSI Design and Test
21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
CHF 127.50
Preise inkl. MwSt. und Versandkosten (Portofrei ab CHF 40.00)
Versandkostenfrei
Produktdetails
Weitere Autoren: Dasgupta, Sudeb (Hrsg.) / Singh, Virendra (Hrsg.)
- ISBN: 978-981-10-7470-7
- EAN: 9789811074707
- Produktnummer: 27992730
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2017
- Seitenangabe: 815 S.
- Plattform: PDF
- Masse: 101'813 KB
- Abbildungen: 486 schwarz-weiße Abbildungen, Bibliographie
- Reihenbandnummer: 711
6 weitere Werke von Brajesh Kumar (Hrsg.) Kaushik:
Bewertungen
Anmelden