Advances in X-Ray Analysis
Volume 25
In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif fraction. This is a fluorescence year, and the three invited lecturers are experts in techniques that are at, or perhaps yet a bit beyond, the forefront of our understanding and technology in that field. The common denominator in selecting these subjects was that each is approaching a full elucidation of theory, and active develop ment of practical hardware, and that each presents analytical pos sibilities which can hardly be ignored in the next gene…
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Produktdetails
- ISBN: 978-1-4613-9995-7
- EAN: 9781461399957
- Produktnummer: 15207602
- Verlag: Springer Us
- Sprache: Englisch
- Erscheinungsjahr: 2012
- Seitenangabe: 420 S.
- Masse: H24.4 cm x B17.0 cm x D2.2 cm 721 g
- Auflage: Softcover reprint of the original 1st ed. 1982
- Abbildungen: Paperback
- Gewicht: 721
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