Thin Film Materials
Stress, Defect Formation and Surface Evolution
Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculat…
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Produktdetails
- ISBN: 978-0-511-16212-1
- EAN: 9780511162121
- Produktnummer: 13845218
- Verlag: Cambridge University Press
- Sprache: Englisch
- Erscheinungsjahr: 2004
- Seitenangabe: 0 S.
- Plattform: PDF
- Masse: 21'145 KB
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