Brent Fultz

Transmission Electron Microscopy and Diffractometry of Materials

Ebook (PDF Format)

This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of p… Mehr

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Produktdetails

Weitere Autoren: Howe, James

ISBN: 978-3-540-73886-2
EAN: 9783540738862
Produktnummer: 33398539
Verlag: Springer-Verlag GmbH
Sprache: Englisch
Erscheinungsjahr: 2007
Seitenangabe: 758 S.
Plattform: PDF
Masse: 47'949 KB
Auflage: 3rd ed. 2008
Abbildungen: 440 schwarz-weiße Abbildungen, 28 schwarz-weiße Tabellen, Bibliographie