Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.
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Produktdetails
- ISBN: 978-0-86341-745-0
- EAN: 9780863417450
- Produktnummer: 15781791
- Verlag: Institution Of Engineering & T
- Sprache: Englisch
- Erscheinungsjahr: 2008
- Seitenangabe: 416 S.
- Masse: H23.1 cm x B15.7 cm x D2.5 cm 612 g
- Reihenbandnummer: 19
- Gewicht: 612
Über den Autor
Yichuang Sun is Professor at the University of Hertfordshire, UK. His research interests are in analogue and mixed-signal circuits, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, wireless and mobile networks.
2 weitere Werke von Yichuang (Hrsg.) Sun:
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