Process Variations and Probabilistic Integrated Circuit Design
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources o…
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Produktdetails
Weitere Autoren: Haase, Joachim (Hrsg.)
- ISBN: 978-1-4419-6621-6
- EAN: 9781441966216
- Produktnummer: 17983573
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2011
- Seitenangabe: 252 S.
- Plattform: PDF
- Masse: 5'767 KB
- Auflage: 2012
- Abbildungen: 32 schwarz-weiße Tabellen, Bibliographie
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