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Suman Lata (Hrsg.) Tripathi

Advanced VLSI Design and Testability Issues

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Produktdetails


Weitere Autoren: Saxena, Sobhit (Hrsg.) / Mohapatra, Sushanta Kumar (Hrsg.)
  • ISBN: 978-0-367-49282-3
  • EAN: 9780367492823
  • Produktnummer: 33732024
  • Verlag: Taylor and Francis
  • Sprache: Englisch
  • Erscheinungsjahr: 2020
  • Seitenangabe: 378 S.
  • Masse: H23.5 cm x B15.6 cm
  • Abbildungen: Farb., s/w. Abb.

Über den Autor


Suman Lata Tripathi is associated with Lovely Professional University, Phagwara, Punjab, as Professor with more than seventeen years of experience in academics. Her area of expertise includes microelectronics device modeling and characterization, low power VLSI circuit design, VLSI design of testing and advance FET design for IOT and biomedical applications etc.Sobhit Saxena is an Associate Professor at Lovely Professional University University, Phagwara, Punjab. His area of expertise includes nanomaterial synthesis and characterization, electrochemical analysis and modeling and simulation of CNT based interconnects for VLSI circuits.S. K. Mohapatra is working as Assistant Professor, in School of Electronics Engineering, Kalinga Institute of Industrial Technology, Bhubaneswar. His research interests include Modeling and Simulation of Nanoscale Devices and its application in IoT. Energy efficient Wireless Sensor Networking, Adhoc Networks, Cellular Communications, Metamaterial absorbers in THz application, UWB-MIMO Antenna, Reconfigurable Antenna, Performance enhancement for high frequency.

22 weitere Werke von Suman Lata (Hrsg.) Tripathi:


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