Diffuse X-Ray Scattering and Models of Disorder
Diffuse X-ray scattering is a rich source of local structural information over and above that obtained by conventional crystallography. The book aims to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed.
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Produktdetails
- ISBN: 978-0-19-958381-2
- EAN: 9780199583812
- Produktnummer: 22670845
- Verlag: OXFORD UNIV PR
- Sprache: Englisch
- Erscheinungsjahr: 2010
- Seitenangabe: 266 S.
- Masse: H23.3 cm x B15.6 cm x D1.4 cm 483 g
- Reihenbandnummer: 16
- Gewicht: 483
Über den Autor
T.R. Welberry took his undergraduate degree at St. John's College Cambridge before obtaining a PhD in Chemical Crystallography at University College London in 1970. He did Post Doctoral research at University College, Cardiff, and from 1975 to the present has been in the Research School of Chemistry at the Australian National University, first at the level of Fellow, then Senior Fellow and now Professor. He was President of SCANZ, The Society of Crystallographers inAustralia and New Zealand (2000-2001).
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