Radiation Effects in Semiconductors
Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE…
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Produktdetails
- ISBN: 978-1-4398-2695-9
- EAN: 9781439826959
- Produktnummer: 29455994
- Verlag: Crc Press
- Sprache: Englisch
- Erscheinungsjahr: 2018
- Seitenangabe: 431 S.
- Plattform: PDF
- Masse: 0 KB
Über den Autor
Krzysztof (Kris) Iniewski is managing R&D chip development activities at Redlen Technologies Inc., a start-up company in British Columbia. His research interests are in VLSI circuits for medical and security applications. From 2004 to 2006 he was an Associate Professor at the Electrical Engineering and Computer Engineering Department of University of Alberta where he conducted research on low-power wireless circuits and systems. During his tenure in Edmonton he wrote Wireless Technologies: Circuits, Systems and Devices (CRC Press). From 1995 to 2003, he was with PMC-Sierra and held various technical and management positions. Prior to joining PMC-Sierra, from 1990 to 1994 he was an Assistant Professor at the University of Toronto's Electrical Engineering and Computer Engineering. Dr. Iniewski has published more than 100 research papers in international journals and conferences. He holds 18 international patents granted in USA, Canada, France, Germany, and Japan. He received his Ph.D. degree in electronics (honors) from the Warsaw University of Technology (Warsaw, Poland) in 1988.
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