Diffuse X-Ray Scattering and Models of Disorder
Diffuse X-ray scattering is a rich (virtually untapped) source of local structural information over and above that obtained by conventional crystallography. The book aims to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds andfrom all types of materials can be interpreted and analyzed. Part I of the book gives a description of the experimental methods used to obtain diffuse scattering data. Part II describes a number of simple stochastic models of disorder, which allows various concepts to be established and enablessimple examples to be generated to illustrate key principles. P…
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Produktdetails
- ISBN: 978-0-19-852858-6
- EAN: 9780198528586
- Produktnummer: 22666450
- Verlag: OXFORD UNIV PR
- Sprache: Englisch
- Erscheinungsjahr: 2004
- Seitenangabe: 266 S.
- Masse: H24.1 cm x B16.2 cm x D2.5 cm 610 g
- Reihenbandnummer: 16
- Gewicht: 610
Über den Autor
T. R. Welberry is Professor of Chemistry at the Institute of Advanced Studies, Australian National University, Canberra, Australia.
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