High-Resolution Electron Microscopy
This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highestquality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconducto…
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Produktdetails
- ISBN: 978-0-19-150840-0
- EAN: 9780191508400
- Produktnummer: 16977891
- Verlag: Oxford University Press
- Sprache: Englisch
- Erscheinungsjahr: 2013
- Seitenangabe: 440 S.
- Plattform: PDF
- Masse: 6'059 KB
- Auflage: 4. Auflage
- Abbildungen: 163 b/w illustrations, 4 colour plates
Über den Autor
John C. H. Spence is Regents' Professor of Physics at Arizona State University with a joint appointment at Lawrence Berkeley Laboratory. He completed a PhD in Physics at Melbourne University in Australia, followed by postdoctoral work in Materials Science at Oxford University, UK. He is a Fellow of the American Physical Society, of the Institute of Physics, of the American Association for the Advancement of Science, and of Churchill College Cambridge, UK. He is arecent co-editor of Acta Crystallographica and served on the editorial board of Reports on Progress in Physics. He has served on the Scientific Advisory Committee of the Molecular Foundry and the Advanced Light Source at the Lawrence Berkeley Laboratory and the DOE's BESAC committee. He has been awardedthe Burton Medal and the Distinguished Scientist Award of the Microscopy Society of America, and the Buerger Medal of the American Crystallographic Association.
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