Efficient Test Methodologies for High-Speed Serial Links
With the increasing demand for higher data bandwidth, communication systems' data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to mitigate the high pin-count and the data-channel skewing problems. However, with the increasing number of I/O pins and greater data rates, significant challenges arise for testing high-speed interfaces in terms of test cost and quality, especially in high volume manufacturing (HVM) environments. Efficient Test Methodologies for High-Speed Serial L…
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Produktdetails
Weitere Autoren: Cheng, Kwang-Ting
- ISBN: 978-90-481-3443-4
- EAN: 9789048134434
- Produktnummer: 13907902
- Verlag: Springer-Verlag GmbH
- Sprache: Englisch
- Erscheinungsjahr: 2009
- Seitenangabe: 98 S.
- Plattform: PDF
- Masse: 3'193 KB
- Auflage: 2010
- Abbildungen: Bibliographie
- Reihenbandnummer: 51
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