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Marc (Hrsg.) Joye

Fault Analysis in Cryptography

Ebook (PDF Format)

In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industry, led to methods of hardening electronic devices designed for harsh environments. Ultimately various mechanisms for fault creation and propagation were discovered, and in particular it was noted that many cryptographic algorithms succumb to so-called fault attacks.Preventing fault attacks without sacrificing performance is nontrivial and this is t… Mehr

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Produktdetails


Weitere Autoren: Tunstall, Michael (Hrsg.)
  • ISBN: 978-3-642-29656-7
  • EAN: 9783642296567
  • Produktnummer: 18251051
  • Verlag: Springer-Verlag GmbH
  • Sprache: Englisch
  • Erscheinungsjahr: 2012
  • Seitenangabe: 356 S.
  • Plattform: PDF
  • Masse: 7'363 KB
  • Auflage: 2012
  • Abbildungen: Bibliographie

Über den Autor


Dr. Marc Joye gained a Habilitation (HDR) degree in Computer Science from the Université de Toulouse II in 2003; from 1999 to 2006, he worked in the Card Security Group of Gemplus (now Gemalto), and he has been a member of the Security & Content Protection Labs of Technicolor since 2006; he has published over 100 scientific articles on many aspects of cryptology, including side-channel attacks and fault attacks. Dr. Mike Tunstall is a researcher in the Bristol Cryptography Group at the University of Bristol; his research interests include smart card security, secure embedded software design; fault-based differential cryptanalysis, fault attacks, and side-channel analysis.

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