David J. Whitehouse

Surfaces and Their Measurement

Buch

The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. -Written by one of the world's leading metrologists-Covers electronics and optics applicat… Mehr

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Produktdetails

ISBN: 978-1-903996-60-7
EAN: 9781903996607
Produktnummer: 1595010
Verlag: Elsevier Science & Technology
Sprache: Englisch
Erscheinungsjahr: 2004
Seitenangabe: 432 S.
Masse: H23.2 cm x B15.7 cm x D3.2 cm 653 g
Auflage: Revised
Gewicht: 653

Über den Autor

David Whitehouse is Professor of Engineering Science and Chief Scientist at the University of Warwick, UK. Member or founder member of a number of international engineering learned and professional bodies, he is author of 180 papers, 22 patents and four books. He is consultant to leading edge instrument manufacturers, Taylor Hobson Ltd.