X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental…
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Produktdetails
- ISBN: 978-3-540-20179-3
- EAN: 9783540201793
- Produktnummer: 8317320
- Verlag: Springer Berlin Heidelberg
- Sprache: Englisch
- Erscheinungsjahr: 2004
- Seitenangabe: 216 S.
- Masse: H24.1 cm x B16.0 cm x D1.6 cm 494 g
- Auflage: 2004
- Abbildungen: HC runder Rücken kaschiert
- Gewicht: 494
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