VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
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Produktdetails
Weitere Autoren: Dasgupta, Sudeb (Hrsg.) / Singh, Virendra (Hrsg.) / Sharma, Rohit (Hrsg.) / Kumar Vishvakarma, Santosh (Hrsg.)
- ISBN: 978-981-3297-66-1
- EAN: 9789813297661
- Produktnummer: 31946099
- Verlag: Springer Nature EN
- Sprache: Englisch
- Erscheinungsjahr: 2019
- Seitenangabe: 775 S.
- Masse: H23.5 cm x B15.5 cm 0 g
- Auflage: 1st ed. 2019
- Abbildungen: Farb., s/w. Abb.
- Reihenbandnummer: 1066
- Sonstiges: Research
1 weiteres Werk von Anirban (Hrsg.) Sengupta:
VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
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