Structural Analysis of Point Defects in Solids
An Introduction to Multiple Magnetic Resonance Spectroscopy
Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimental,technological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint,…
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Produktdetails
Weitere Autoren: Niklas, Jürgen R. / Bartram, Ralph H.
- ISBN: 978-3-642-84405-8
- EAN: 9783642844058
- Produktnummer: 37924233
- Verlag: Springer Berlin Heidelberg
- Sprache: Englisch
- Erscheinungsjahr: 2012
- Seitenangabe: 367 S.
- Plattform: PDF
- Auflage: 1992
- Reihenbandnummer: 43
3 weitere Werke von Johann-Martin Spaeth:
Point Defects in Semiconductors and Insulators
An Introduction to Multiple Magnetic Resonance Spectroscopy
An Introduction to Multiple Magnetic Resonance Spectroscopy
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