Scanning Electron Microscopy and X-Ray Microanalysis
Third Edition
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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Produktdetails
Weitere Autoren: Newbury, Dale E. / Joy, David C. / Lyman, Charles E. / Echlin, Patrick / Lifshin, Eric / Sawyer, Linda / Michael, J. R.
- ISBN: 978-1-4615-0215-9
- EAN: 9781461502159
- Produktnummer: 37296870
- Verlag: Springer US
- Sprache: Englisch
- Erscheinungsjahr: 2012
- Seitenangabe: 689 S.
- Plattform: PDF
- Auflage: 3rd ed. 2003
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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
Third Edition
Third Edition
Ebook (PDF Format)
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