Scanning Electron Microscopy and X-Ray Microanalysis
Third Edition
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using…
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Produktdetails
Weitere Autoren: Newbury, Dale E. / Joy, David C. / Lyman, Charles E. / Echlin, Patrick / Lifshin, Eric / Sawyer, Linda / Michael, J.R.
- ISBN: 978-0-306-47292-3
- EAN: 9780306472923
- Produktnummer: 1805695
- Verlag: Springer Nature EN
- Sprache: Englisch
- Erscheinungsjahr: 2007
- Seitenangabe: 689 S.
- Masse: 1 Ex.; H25.4 cm x B17.8 cm x D3.5 cm 2'048 g
- Auflage: 3. A.
- Abbildungen: Book w. online files / update
- Gewicht: 2048
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