Quantum Metrology, Imaging, and Communication
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
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Produktdetails
Weitere Autoren: Sergienko, Alexander V. / Simon, David S.
- ISBN: 978-3-319-83540-2
- EAN: 9783319835402
- Produktnummer: 28394157
- Verlag: Springer International Publishing
- Sprache: Englisch
- Erscheinungsjahr: 2018
- Seitenangabe: 288 S.
- Masse: H23.5 cm x B15.5 cm x D1.5 cm 441 g
- Auflage: Softcover reprint of the original 1st ed. 2017
- Abbildungen: Paperback
- Gewicht: 441
Über den Autor
David Simon. Professor, Stonehill College, Easton MA 02357, USA Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA Alexander V. Sergienko, Boston University, Boston MA 02215, USA
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