Principles of Analytical Electron Microscopy
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the physics of the processes and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of An…
Mehr
CHF 130.00
Preise inkl. MwSt. und Versandkosten (Portofrei ab CHF 40.00)
Versandkostenfrei
Produktdetails
Weitere Autoren: Joy, David C. (Hrsg.) / Romig Jr., Alton D. (Hrsg.)
- ISBN: 978-1-4899-2037-9
- EAN: 9781489920379
- Produktnummer: 37299649
- Verlag: Springer US
- Sprache: Englisch
- Erscheinungsjahr: 2013
- Seitenangabe: 448 S.
- Plattform: PDF
- Auflage: 1986
7 weitere Werke von Joseph (Hrsg.) Goldstein:
Bewertungen
Anmelden