Mismatch and Noise in Modern IC Processes
Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block circuits of modern integrated circuits, from the perspective of a circuit designer.Variability usually refers to a large scale variation that can occur on a wafer to wafer and lot to lot basis, and over long distances on a wafer. This phenomenon is well understood and the effects of variability are included in most integrated circuit design with the use of corner or statistical component models. Mismat…
Mehr
CHF 47.90
Preise inkl. MwSt. und Versandkosten (Portofrei ab CHF 40.00)
V103:
Folgt in ca. 5 Arbeitstagen
Produktdetails
- ISBN: 978-3-031-79790-3
- EAN: 9783031797903
- Produktnummer: 39058088
- Verlag: Springer International Publishing
- Sprache: Englisch
- Erscheinungsjahr: 2009
- Seitenangabe: 152 S.
- Masse: H23.5 cm x B19.1 cm x D0.8 cm 298 g
- Abbildungen: Paperback
- Gewicht: 298
Über den Autor
Andrew Marshall has more than 25 years of experience in the semiconductor industry in a variety of areas including material characterization, process and device development, mixed signal integrated circuit design, and circuit simulation. Dr. Marshall has 45 issued patents and 60 published papers. He is co-author of the book SOI Design: Analog, Memory and Digital Techniques and is a Fellow of the Institute of Physics and a Senior Member of the IEEE.
81 weitere Werke von Andrew Marshall:
Bewertungen
Anmelden