MOS Interface Physics, Process and Characterization
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Produktdetails
Weitere Autoren: Wang, Xiaolei
- ISBN: 978-1-03-210627-4
- EAN: 9781032106274
- Produktnummer: 36093100
- Verlag: Taylor and Francis
- Sprache: Englisch
- Erscheinungsjahr: 2021
- Seitenangabe: 174 S.
- Masse: H22.9 cm x B15.2 cm
- Abbildungen: Farb., s/w. Abb.
Über den Autor
Shengkai Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the University of Tokyo in 2011 and has been engaged in Ge, III-V, SiC in MOS technology. He has published more than 100 papers and authorized 40+ patents. Xiaolei Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the Institute of Microelectronics, Chinese Academy of Sciences in 2013 and has been engaged in Si/Ge based MOS technology. He has published more than 100 papers.
2 weitere Werke von Shengkai Wang:
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