Introduction to Scanning Tunneling Microscopy Third Edition
This third edition is a thoroughly updated and improved version of the recognized Bible of the field.
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V211:
Noch nicht erschienen, Februar 2021
Produktdetails
- ISBN: 978-0-19-885655-9
- EAN: 9780198856559
- Produktnummer: 34407053
- Verlag: Oxford Academic
- Sprache: Englisch
- Erscheinungsjahr: 2021
- Seitenangabe: 528 S.
- Masse: H23.4 cm x B15.6 cm
- Abbildungen: 275
- Reihenbandnummer: 69
Über den Autor
C. Julian Chen received a PhD in Physics from Columbia University in 1985, and then joined the Department of Physical Sciences of IBM Watson Research Centre. In 1993, he published Introduction to Scanning Tunnelling Microscopy, and received a National Outstanding Book Award from China in 1997. From 1993 to 2003 he joined the Department of Human Language Technology of IBM Research. In 1998 he received an Outstanding Innovation Award from IBM for inventing practicalrecognition technology for Chinese speech. From 2004 to 2006 he was a Guest Scientist at Hamburg University. In 2007 he joined the Department of Applied Physics and Applied Mathematics at Columbia University.
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